Detection of surface defects in film-coated metals and measurement of coating thickness

Xiaoqing Yang; Junlong Chen; Yi Xie; Piqiang Su; Jiefang Luo; Xuexue Lei; Hui Xiao; Jianping Yuan; Zhanxia Zhu

doi:10.1063/1.5109480

Detection of surface defects in film-coated metals and measurement of coating thickness

Xiaoqing Yang, Junlong Chen, Yi Xie, Piqiang Su, Jiefang Luo, Xuexue Lei, Hui Xiao, Jianping Yuan, Zhanxia Zhu

航天学院

科研成果: 期刊稿件 › 文章 › 同行评审

1 引用（Scopus）

摘要

A novel sensor based on the interdigitated structure is presented to detect surface defects in film-coated metals and measure coating thickness. The detection and measurement are based on monitoring the shift of resonance frequency which is caused by the perturbation of electromagnetic field around the interdigitated structure. A 200-μm-wide defect was successfully detected in the experiment. In addition, the numerical simulations show that the designed sensor can detect a 50-μm-wide defect with a 220 MHz shift in the resonance frequency. The sensor is sensitive, inexpensive, portable, and can detect both defects and measure coating thickness.

源语言	英语
文章编号	095005
期刊	Review of Scientific Instruments
卷	90
期	9
DOI	https://doi.org/10.1063/1.5109480
出版状态	已出版 - 1 9月 2019

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abstract = "A novel sensor based on the interdigitated structure is presented to detect surface defects in film-coated metals and measure coating thickness. The detection and measurement are based on monitoring the shift of resonance frequency which is caused by the perturbation of electromagnetic field around the interdigitated structure. A 200-μm-wide defect was successfully detected in the experiment. In addition, the numerical simulations show that the designed sensor can detect a 50-μm-wide defect with a 220 MHz shift in the resonance frequency. The sensor is sensitive, inexpensive, portable, and can detect both defects and measure coating thickness.",

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AU - Yang, Xiaoqing

AU - Chen, Junlong

AU - Xie, Yi

AU - Su, Piqiang

AU - Luo, Jiefang

AU - Lei, Xuexue

AU - Xiao, Hui

AU - Yuan, Jianping

AU - Zhu, Zhanxia

PY - 2019/9/1

Y1 - 2019/9/1

N2 - A novel sensor based on the interdigitated structure is presented to detect surface defects in film-coated metals and measure coating thickness. The detection and measurement are based on monitoring the shift of resonance frequency which is caused by the perturbation of electromagnetic field around the interdigitated structure. A 200-μm-wide defect was successfully detected in the experiment. In addition, the numerical simulations show that the designed sensor can detect a 50-μm-wide defect with a 220 MHz shift in the resonance frequency. The sensor is sensitive, inexpensive, portable, and can detect both defects and measure coating thickness.

AB - A novel sensor based on the interdigitated structure is presented to detect surface defects in film-coated metals and measure coating thickness. The detection and measurement are based on monitoring the shift of resonance frequency which is caused by the perturbation of electromagnetic field around the interdigitated structure. A 200-μm-wide defect was successfully detected in the experiment. In addition, the numerical simulations show that the designed sensor can detect a 50-μm-wide defect with a 220 MHz shift in the resonance frequency. The sensor is sensitive, inexpensive, portable, and can detect both defects and measure coating thickness.

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JO - Review of Scientific Instruments

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Detection of surface defects in film-coated metals and measurement of coating thickness

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