Defect identification by sensor network under uncertainties

Tomonari Furukawa, Jinquan Cheng, Shen Hin Lim, Fei Xu, Ryuji Shioya

科研成果: 书/报告/会议事项章节会议稿件同行评审

3 引用 (Scopus)

摘要

This paper presents a theoretical framework for identification of defects by a sensor network under uncertainties. While location of sensors are not known due to their inspection due to limited knowledge on the structure to be inspected, existing inspection methods do not take uncertainties of sensor locations into account for the localization of defects. The proposed theoretical framework formulates the uncertainties of sensor states stemming from both motion and measurement and allows stochastic identification of defects using recursive Beyesian estimation. Multi-sensor belief fusion further allows a network of sensors to jointly identify defects and improve the accuracy of identification. Parametric studies and application to practical defect identification have shown the validity of the proposed framework.

源语言英语
主期刊名Proceedings - 2010 International Conference on Broadband, Wireless Computing Communication and Applications, BWCCA 2010
155-158
页数4
DOI
出版状态已出版 - 2010
活动5th International Conference on Broadband Wireless Computing, Communication and Applications, BWCCA 2010 - Fukuoka, 日本
期限: 4 11月 20106 11月 2010

出版系列

姓名Proceedings - 2010 International Conference on Broadband, Wireless Computing Communication and Applications, BWCCA 2010

会议

会议5th International Conference on Broadband Wireless Computing, Communication and Applications, BWCCA 2010
国家/地区日本
Fukuoka
时期4/11/106/11/10

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