摘要
YMn0.9Cr0.1O3 polycrystalline material was synthesized by conventional solid-state reaction method. The crystalline structure and dielectric properties of YMn0.9Cr0.1O3 were investigated. YMn0.9Cr0.1O3 ceramic is proved to be a hexagonal structure with P63cm space group by the X-ray diffraction. The temperature dependence of dielectric constant and loss curves indicate YMnO3 and YMn0.9Cr0.1O3 samples exhibit an obvious dielectric relaxation behavior at low temperature range. The frequency dependence of dielectric loss peak follows an Arrhenius law. The XPS analysis suggest that the increase in valence compensation and the decrease in oxide vacancy compensation cause lower dielectric constant in the Cr doped YMn0.9Cr0.1O3 sample.
源语言 | 英语 |
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页(从-至) | 3082-3087 |
页数 | 6 |
期刊 | Journal of Materials Science: Materials in Electronics |
卷 | 27 |
期 | 3 |
DOI | |
出版状态 | 已出版 - 1 3月 2016 |