Close-space sublimation growth and characterization of ZnTe epitaxial thick film

Jiawei Li, Gangqiang Zha, Yadong Xu, Shouzhi Xi, Yingrui Li, Rui Yang, Wanqi Jie

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

ZnTe epitaxial film with thickness of 200μm was grown on the GaAs substrate by close-space sublimation (CSS). The surface topography of ZnTe film was analyzed by SEM, and the evolution of growth pit was observed, which revealed the mechanism of epitaxial growth. The structure was analyzed by X-ray radiation diffraction (XRD) θ-2θ scan and rotary φ-scan, and the results suggested that the ZnTe thick film is epitaxial film. The crystalline quality of ZnTe thick film was characterized by X-ray rocking curve and Raman spectrum, and the results suggested that ZnTe epitaxial film obtained by CSS could be as a replacement of ZnTe single crystal, especially for thinner and larger requirement.

源语言英语
主期刊名IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781479982721
DOI
出版状态已出版 - 11 11月 2015
活动40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015 - Hong Kong, 中国
期限: 23 8月 201528 8月 2015

出版系列

姓名IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves

会议

会议40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015
国家/地区中国
Hong Kong
时期23/08/1528/08/15

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