CdZnTe晶体热激电流谱分析

Xu Fu, Fang Bao Wang, Ling Yan Xu, Ya Dong Xu, Wan Qi Jie

科研成果: 期刊稿件文章同行评审

2 引用 (Scopus)

摘要

Thermally stimulated current (TSC) spectroscopy is a quite effective method for the defects studies in wide bandgap semiconductors, from which the physical information, i. e. defect types, activation energy (Ea, i), concentration (Ni) and capture cross-section (σi), can be given. The discrepancy and effects of heating-rate-dependent Arrhenius method and simultaneous multiple peak analysis (SIMPA) on the data processing results of TSC were studied in this work. The results indicated that Arrhenius method were more accurate in terms of the thermal activation energy of different traps. However, more heating rate, which meaned longer test cycles, were needed to maintain the accuracy. And also, this method could not deal with conditions of traps over-lap. In contrast, the SIMPA method could obtain the trap signatures (Ea, i, Ni, σi) with only one heating rate. However, parameters, i. e. β, Ea, i, σi and carrier mobility and lifetime product (μt), had significant effects on the peak position, height and width, which directly influenced the results of the fitting curve. Furthermore, the IRTM images of sample from the head of the ingots showed lower concentration of Te inclusions with belt-like distribution compared to that from the tail. Through the investigation of TSC spectroscopy, the concentration of shallow levels were much higher in the sample from the tail of the ingots than that from the head. The low temperature persistent photoconductivity (PPC) experiments showed a curvilineal variation for the tail sample. The results showed that the concentration and distribution of Te inclusions could probably result in the concentration variation of shallow trap centers, which present longer trapping time and shorter de-trapping time of optical excited carriers in crystal.

投稿的翻译标题Study on the Analytical Method of Thermally Stimulated Current Spectroscopy of CdZnTe Crystal
源语言繁体中文
页(从-至)340-345
页数6
期刊Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis
38
2
DOI
出版状态已出版 - 1 2月 2018

关键词

  • Arrhenius method
  • CdZnTe
  • Deep Level Defects
  • SIMPA method
  • TSC

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