Baking Status Characterization of Baked Food Image Based on Superpixel Segmentation

Conghui Wang, Bochuan Hou, Jing Shi, Jianhua Yang, Boning Wu, Zixing Fu, Kun Fang

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The temperature field distribution of the oven directly affects the quality of the baked food. The traditional oven performance research mainly focuses on the heating method in the simulated oven, lacking quantitative analysis of the baked food. In this paper, the digital image processing technology is used to segment and extract different baking status of the baked food in order to qualitatively and quantitatively expresses the internal temperature field distribution of the oven. Firstly, the image of baked food is captured by high-definition digital camera. And then it will be preprocessed to obtain a denoised image with only baked food area. Thirdly, the simple linear iterative clustering (SLIC) segmentation is used to extract the different baking status. The experimental results show that the simple linear iterative clustering (SLIC) segmentation algorithm can digitally express the baking status in the form of superpixels. The proposed method can qualitatively and quantitatively reflect the distribution of the temperature field inside the oven corresponding to the baked food image, which provide a basis for further evaluation of the heat distribution field inside the oven.

源语言英语
主期刊名IST 2019 - IEEE International Conference on Imaging Systems and Techniques, Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781728138688
DOI
出版状态已出版 - 12月 2019
活动2019 IEEE International Conference on Imaging Systems and Techniques, IST 2019 - Abu Dhabi, 阿拉伯联合酋长国
期限: 8 12月 201910 12月 2019

出版系列

姓名IST 2019 - IEEE International Conference on Imaging Systems and Techniques, Proceedings

会议

会议2019 IEEE International Conference on Imaging Systems and Techniques, IST 2019
国家/地区阿拉伯联合酋长国
Abu Dhabi
时期8/12/1910/12/19

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