TY - GEN
T1 - A novel model for component-based software reliability analysis
AU - Zhang, Fan
AU - Zhou, Xingshe
AU - Chen, Junwen
AU - Dong, Yunwei
PY - 2008
Y1 - 2008
N2 - Component-based software reliability analysis typically takes the reliability of component as an invariable property of component itself, disregards the fact that it changes when the component context it interacts changes due to a different operational profile of the system. This paper introduces a subdomain-based analysis approach to characterize the component into path-based architectural reliability model, and provides the enhanced composition algorithms to solve the model. The application analysis of a case study indicates that our model is able to fully capture the effect of different operational profiles on the overall reliability of system, from aspects of both transition probability and component reliability. This ability will benefit reliability analysis of more accuracy and flexibility.
AB - Component-based software reliability analysis typically takes the reliability of component as an invariable property of component itself, disregards the fact that it changes when the component context it interacts changes due to a different operational profile of the system. This paper introduces a subdomain-based analysis approach to characterize the component into path-based architectural reliability model, and provides the enhanced composition algorithms to solve the model. The application analysis of a case study indicates that our model is able to fully capture the effect of different operational profiles on the overall reliability of system, from aspects of both transition probability and component reliability. This ability will benefit reliability analysis of more accuracy and flexibility.
UR - http://www.scopus.com/inward/record.url?scp=58449134333&partnerID=8YFLogxK
U2 - 10.1109/HASE.2008.41
DO - 10.1109/HASE.2008.41
M3 - 会议稿件
AN - SCOPUS:58449134333
SN - 9780769534824
T3 - Proceedings of IEEE International Symposium on High Assurance Systems Engineering
SP - 303
EP - 309
BT - Proceedings - 11th IEEE High Assurance Systems Engineering Symposium, HASE 2008
T2 - 11th IEEE High Assurance Systems Engineering Symposium, HASE 2008
Y2 - 3 December 2008 through 5 December 2008
ER -