A method for assessing soft error rate based on the resource configuration of netlist-level circuit topology in SRAM-based FPGAS

Guochang Zhou, Xiang Gao, Xiaoling Lai, Qi Zhu, Yangming Guo

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

For the effect of signal propagation in the programmable logic device caused by single event effects (SEE) of the space environment, a method for assessing soft error rate based on the resource configuration of netlist-level circuit topology by SEE is proposed in this paper. This method makes use of the mapping relationship between the synthesized netlist and the device resource. Then the construction of signal logical propagation topology is closer to the physical layer through the algorithm of depth first search and the matching rules of control bits. Therefore, the propagation model for assessing soft-error propagation probability among the outputs in system is built based on the logic circuit signal propagation relationship, which is able to enhance the calculation accuracy of soft error rate. Ultimately, an engineering example is verified that this method could be able to effective and better evaluate design effect of mitigating SEE in circuit system.

源语言英语
主期刊名Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016
编辑Qiang Miao, Zhaojun Li, Ming J. Zuo, Liudong Xing, Zhigang Tian
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781509027781
DOI
出版状态已出版 - 16 1月 2017
活动7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 - Chengdu, Sichuan, 中国
期限: 19 10月 201621 10月 2016

出版系列

姓名Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

会议

会议7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016
国家/地区中国
Chengdu, Sichuan
时期19/10/1621/10/16

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