TY - JOUR
T1 - A framework for process states structural interpretation of zero-defect manufacturing
AU - Xu, Zihan
AU - Guo, Zhengang
AU - Zhang, Geng
AU - Zhou, Xueliang
AU - Zhang, Yingfeng
N1 - Publisher Copyright:
© 2024
PY - 2024/4
Y1 - 2024/4
N2 - Recent advances in quality manufacturing research have focused on the industrial landing of Zero-defect Manufacturing (ZDM) which is aiming toward a more precise, robust, and sustainable production paradigm. A systematic deployment platform for ZDM implementation need to take advantage of the various advanced technologies and integrate them. Cyber-physical system (CPS) is a critical framework and low-rank representation (LRR) is the method which has widely used in computer vision, signal processing and other research areas. This paper describes a novel framework based on the interdisciplinary integration of cyber-physical architecture and low-rank representation, which is named the CPS-ZDM-LRR framework. It transforms the quality control problem into the signal monitoring, to complete the process states interpretation and deal with the hidden defect problem in ZDM. Through the continuous monitoring of products and equipment’ status during manufacturing process, the real-time raw data from different sources has been preprocessed to the time series features which are slide keyframe matrices, and LRR used to search the low-rank structure of slide keyframe matrices which can help us recognize the current status of manufacturing system deeply and give the preventive measures suggestion for quality assurance. Finally, an simulation experiment will validate our framework and show its performance in zero-defect manufacturing.
AB - Recent advances in quality manufacturing research have focused on the industrial landing of Zero-defect Manufacturing (ZDM) which is aiming toward a more precise, robust, and sustainable production paradigm. A systematic deployment platform for ZDM implementation need to take advantage of the various advanced technologies and integrate them. Cyber-physical system (CPS) is a critical framework and low-rank representation (LRR) is the method which has widely used in computer vision, signal processing and other research areas. This paper describes a novel framework based on the interdisciplinary integration of cyber-physical architecture and low-rank representation, which is named the CPS-ZDM-LRR framework. It transforms the quality control problem into the signal monitoring, to complete the process states interpretation and deal with the hidden defect problem in ZDM. Through the continuous monitoring of products and equipment’ status during manufacturing process, the real-time raw data from different sources has been preprocessed to the time series features which are slide keyframe matrices, and LRR used to search the low-rank structure of slide keyframe matrices which can help us recognize the current status of manufacturing system deeply and give the preventive measures suggestion for quality assurance. Finally, an simulation experiment will validate our framework and show its performance in zero-defect manufacturing.
KW - Cyber-physical system
KW - Low-rank representation
KW - Process states interpretation
KW - Quality assurance
KW - Sustainable production paradigm
KW - Zero-defect manufacturing
UR - http://www.scopus.com/inward/record.url?scp=85186496410&partnerID=8YFLogxK
U2 - 10.1016/j.aei.2024.102442
DO - 10.1016/j.aei.2024.102442
M3 - 文章
AN - SCOPUS:85186496410
SN - 1474-0346
VL - 60
JO - Advanced Engineering Informatics
JF - Advanced Engineering Informatics
M1 - 102442
ER -