A competition on generalized software-based face presentation attack detection in mobile scenarios

Z. Boulkenafet, J. Komulainen, Z. Akhtar, A. Benlamoudi, D. Samai, S. E. Bekhouche, A. Ouafi, F. Dornaika, A. Taleb-Ahmed, L. Qin, F. Peng, L. B. Zhang, M. Long, S. Bhilare, V. Kanhangad, A. Costa-Pazo, E. Vazquez-Fernandez, D. Pérez-Cabo, J. J. Moreira-Pérez, D. González-JiménezA. Mohammadi, S. Bhattacharjee, S. Marcel, S. Volkova, Y. Tang, N. Abe, L. Li, X. Feng, Z. Xia, X. Jiang, S. Liu, R. Shao, P. C. Yuen, W. R. Almeida, F. Andaló, R. Padilha, G. Bertocco, W. Dias, J. Wainer, R. Torres, A. Rocha, M. A. Angeloni, G. Folego, A. Godoy, A. Hadid

科研成果: 书/报告/会议事项章节会议稿件同行评审

123 引用 (Scopus)

摘要

In recent years, software-based face presentation attack detection (PAD) methods have seen a great progress. However, most existing schemes are not able to generalize well in more realistic conditions. The objective of this competition is to evaluate and compare the generalization performances of mobile face PAD techniques under some real-world variations, including unseen input sensors, presentation attack instruments (PAI) and illumination conditions, on a larger scale OULU-NPU dataset using its standard evaluation protocols and metrics. Thirteen teams from academic and industrial institutions across the world participated in this competition. This time typical liveness detection based on physiological signs of life was totally discarded. Instead, every submitted system relies practically on some sort of feature representation extracted from the face and/or background regions using hand-crafted, learned or hybrid descriptors. Interesting results and findings are presented and discussed in this paper.

源语言英语
主期刊名IEEE International Joint Conference on Biometrics, IJCB 2017
出版商Institute of Electrical and Electronics Engineers Inc.
688-696
页数9
ISBN(电子版)9781538611241
DOI
出版状态已出版 - 1 7月 2017
活动2017 IEEE International Joint Conference on Biometrics, IJCB 2017 - Denver, 美国
期限: 1 10月 20174 10月 2017

出版系列

姓名IEEE International Joint Conference on Biometrics, IJCB 2017
2018-January

会议

会议2017 IEEE International Joint Conference on Biometrics, IJCB 2017
国家/地区美国
Denver
时期1/10/174/10/17

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