XPS study on the perfluoropolyether derivative lubricating film on hard disk

Shangkui Qi, Laigui Yu, Weimin Liu, Qunji Xue

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

The physical and chemical structure of the lubricating film (commercial name: Z-DOL) on hard disk were investigated. The various radicals in the chemical structure of a lubricant molecule were found to be identifiable from the relevant XPS spectra of Cls; while the thickness of the lubricant film was determined from the peak intensity ratio of Ols(C-O) with respect to the protective layer CNx on the hard disk to that in perfluoropolyether (Radical F-O). It was found that the film thickness is variable within a range of 1.5-6.0 nm depending on the process for preparing the lubricating film on the hard disk.

Original languageEnglish
Pages (from-to)239-243
Number of pages5
JournalMocaxue Xuebao/Tribology
Volume19
Issue number3
StatePublished - Sep 1999

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