Transmission electron microscopy study of multilayer p-n hetero-junction La0.9Sr0.1MnO3/SrNb0.05Ti 0.95O3 thin films

H. C. Yu, M. P. Wang, Y. L. Jia, C. Chen, W. C. Yang, C. D. Xia, L. F. Liu, Y. G. Wang

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Abstract

We have fabricated multilayer p-n hetero-junction structure La 0.9Sr0.1MnO3/SrNb0.05Ti 0.95O3 colossal magneto-resistivity thin films. The observations of transmission electron microscopy showed that the interfacial structure between La0.9Sr0.1MnO3 and SrNb 0.05Ti0.95O3 was of great epitaxy and atomic level smooth. There was a superstructure within La0.9Sr 0.1MnO3 thin films which was clarified in terms of the ordered partial substitution of La with Sr at center body of unit cell. Its chemical composition and distribution information investigated by electron energy loss spectrum and element mapping in the multilayer thin films were discussed.

Original languageEnglish
Pages (from-to)2079-2082
Number of pages4
JournalThin Solid Films
Volume519
Issue number7
DOIs
StatePublished - 31 Jan 2011
Externally publishedYes

Keywords

  • CMR thin films
  • EELS
  • Element mapping
  • HREM
  • Microstructure

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