The Third Monocular Depth Estimation Challenge

Jaime Spencer, Fabio Tosi, Matteo Poggi, Ripudaman Singh Arora, Chris Russell, Simon Hadfield, Richard Bowden, Guang Yuan Zhou, Zheng Xin Li, Qiang Rao, Yi Ping Bao, Xiao Liu, Dohyeong Kim, Jinseong Kim, Myunghyun Kim, Mykola Lavreniuk, Rui Li, Qing Mao, Jiang Wu, Yu ZhuJinqiu Sun, Yanning Zhang, Suraj Patni, Aradhye Agarwal, Chetan Arora, Pihai Sun, Kui Jiang, Gang Wu, Jian Liu, Xianming Liu, Junjun Jiang, Xidan Zhang, Jianing Wei, Fangjun Wang, Zhiming Tan, Jiabao Wang, Albert Luginov, Muhammad Shahzad, Seyed Hosseini, Aleksander Trajcevski, James H. Elder

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

This paper discusses the results of the third edition of the Monocular Depth Estimation Challenge (MDEC). The challenge focuses on zero-shot generalization to the challenging SYNS-Patches dataset, featuring complex scenes in natural and indoor settings. As with the previous edition, methods can use any form of supervision, i.e. supervised or self-supervised. The challenge received a total of 19 submissions outperforming the baseline on the test set: 10 among them submitted a report describing their approach, highlighting a diffused use of foundational models such as Depth Anything at the core of their method. The challenge winners drastically improved 3D F-Score performance, from 17.51% to 23.72%.

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
PublisherIEEE Computer Society
Pages1-14
Number of pages14
ISBN (Electronic)9798350365474
DOIs
StatePublished - 2024
Event2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024 - Seattle, United States
Duration: 16 Jun 202422 Jun 2024

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
Country/TerritoryUnited States
CitySeattle
Period16/06/2422/06/24

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