The rate-limiting step in the thermal oxidation of silicon carbide

Junjie Wang, Litong Zhang, Qingfeng Zeng, Gérard L. Vignoles, Laifei Cheng, Alain Guette

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

Using first-principles density-functional calculations of the total energy, we performed a systematic study of the diffusion activation energies of O2 and CO in SiO2 and Si1-xCxO2. Our results suggest that the dense Si1-xCxO2 (e.g., Si2CO6) layer may play a critical role in the SiC thermal oxidation process. The out-diffusion of CO through SiO2 or Si2CO6 is the controlling step of the SiC thermal oxidation. Known experimental data are explained well by our results.

Original languageEnglish
Pages (from-to)654-657
Number of pages4
JournalScripta Materialia
Volume62
Issue number9
DOIs
StatePublished - May 2010

Keywords

  • CO
  • Deal-Grove model
  • Diffusion
  • SiC oxidation

Fingerprint

Dive into the research topics of 'The rate-limiting step in the thermal oxidation of silicon carbide'. Together they form a unique fingerprint.

Cite this