Abstract
Using first-principles density-functional calculations of the total energy, we performed a systematic study of the diffusion activation energies of O2 and CO in SiO2 and Si1-xCxO2. Our results suggest that the dense Si1-xCxO2 (e.g., Si2CO6) layer may play a critical role in the SiC thermal oxidation process. The out-diffusion of CO through SiO2 or Si2CO6 is the controlling step of the SiC thermal oxidation. Known experimental data are explained well by our results.
Original language | English |
---|---|
Pages (from-to) | 654-657 |
Number of pages | 4 |
Journal | Scripta Materialia |
Volume | 62 |
Issue number | 9 |
DOIs | |
State | Published - May 2010 |
Keywords
- CO
- Deal-Grove model
- Diffusion
- SiC oxidation