Abstract
The effect of passivation with NH4F/H2O2 agent on p-CZT surface is studied by synchrotron photoemission spectroscopy (SRPES). It is found that the peak representing surface states disappeares after the passivation treatment. Two processing methods, without passivation treatment and with passivation treatment are adopted to compare the effects of passivation treatment. The interface barrier between Au contact and p-CZT is studied by synchrotron photoemission spectroscopy (SRPES), where the interface barrier is determined by the discrepancy between Ev-c deduced by the core level with valence band region and EB deduced by the core level with the Fermi edge. The interface barrier is determined to be (0.88±0.1)eV for Au/p-CZT without passivation and for Au/p-CZT after passivation, respectively.
Original language | English |
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Pages (from-to) | 1146-1148 |
Number of pages | 3 |
Journal | Gongneng Cailiao/Journal of Functional Materials |
Volume | 37 |
Issue number | 7 |
State | Published - Jul 2006 |
Keywords
- Interface barrier
- Passivation
- Synchrotron photoemission spectroscopy (SRPES)