Stress intensity factors analysis for crack around film cooling holes in Ni-based single crystal with contour integral method

Zhenwei Li, Zhixun Wen, Cheng Wang, Ying Dai, Peng Fei He

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Purpose: This paper aims to provide SIF calculation method for engineering application. Design/methodology/approach: In this paper, the stress intensity factors (SIFs) calculation method is applied to the anisotropic Ni-based single crystal film cooling holes (FCHs) structure. Findings: Based on contour integral, the anisotropic SIFs analysis finite element method (FEM) in Ni-based single crystal is proposed. The applicability and mesh independence of the method is assessed by comparing the calculated SIFs using mode of plate with an edge crack. Anisotropic SIFs can be calculated with excellent accuracy using the finite element contour integral approach. Then, the effect of crystal orientation and FCHs interference on the anisotropic SIFs is clarified. The SIFs of FCH edge crack in the [011] orientated Ni-based single crystal increases faster than the other two orientations. And the SIF of horizontal interference FCHs edge crack is also larger than that of the inclined interference one. Originality/value: The SIFs of the FCH edge crack in the turbine air-cooled blade are innovatively computed using the sub-model method. Both the Mode I and II SIFs of FCHs edge crack in blade increase with crack growing.

Original languageEnglish
Pages (from-to)18-39
Number of pages22
JournalMultidiscipline Modeling in Materials and Structures
Volume20
Issue number1
DOIs
StatePublished - 29 Jan 2024

Keywords

  • Contour integral method
  • Film cooling holes
  • Ni-based single crystal
  • Stress intensity factor
  • Sub model method

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