TY - GEN
T1 - Single event upset reliability assessment for RAM based on maximum entropy principle and bootstrap
AU - Zhang, Zhongqing
AU - Fu, Guicui
AU - Guo, Wendi
AU - Su, Yutai
AU - Wang, Bo
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2019/1/4
Y1 - 2019/1/4
N2 - In the harsh radiation environment, Random Access Memory (RAM) fails due to Single Event Upset (SEU). The failure of the RAM seriously threatens the safety and reliability of on-orbit spacecraft. For devices with Error Detection and Correction (EDAC) enhanced, this paper provides a reliability assessment methodology using small sample test data combined with Maximum Entropy Principle (MEP) and Bootstrap. First, using ground and orbit test data with MEP, the optimal distribution function of SEU rate is determined. Second, the confidence intervals of the function arguments under different confidence levels are estimated by the parametric Bootstrap method. Then, a Single Event Upset reliability assessment methodology is proposed for RAM with EDAC enhanced. Finally, using the ground and orbit test data combined with above methods, a case study of reliability assessment for RAM is given. The assessment can be combined with small sample data to quantitatively evaluate the reliability of RAM under EDAC enhanced. The assessment methodology in this paper has the characteristics of strong applicability and good portability.
AB - In the harsh radiation environment, Random Access Memory (RAM) fails due to Single Event Upset (SEU). The failure of the RAM seriously threatens the safety and reliability of on-orbit spacecraft. For devices with Error Detection and Correction (EDAC) enhanced, this paper provides a reliability assessment methodology using small sample test data combined with Maximum Entropy Principle (MEP) and Bootstrap. First, using ground and orbit test data with MEP, the optimal distribution function of SEU rate is determined. Second, the confidence intervals of the function arguments under different confidence levels are estimated by the parametric Bootstrap method. Then, a Single Event Upset reliability assessment methodology is proposed for RAM with EDAC enhanced. Finally, using the ground and orbit test data combined with above methods, a case study of reliability assessment for RAM is given. The assessment can be combined with small sample data to quantitatively evaluate the reliability of RAM under EDAC enhanced. The assessment methodology in this paper has the characteristics of strong applicability and good portability.
KW - Bootstrap method
KW - EDAC
KW - Maximum entropy principle
KW - Reliability assessment
UR - http://www.scopus.com/inward/record.url?scp=85061817641&partnerID=8YFLogxK
U2 - 10.1109/PHM-Chongqing.2018.00039
DO - 10.1109/PHM-Chongqing.2018.00039
M3 - 会议稿件
AN - SCOPUS:85061817641
T3 - Proceedings - 2018 Prognostics and System Health Management Conference, PHM-Chongqing 2018
SP - 191
EP - 195
BT - Proceedings - 2018 Prognostics and System Health Management Conference, PHM-Chongqing 2018
A2 - Ding, Ping
A2 - Li, Chuan
A2 - Yang, Shuai
A2 - Ding, Ping
A2 - Sanchez, Rene-Vinicio
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 Prognostics and System Health Management Conference, PHM-Chongqing 2018
Y2 - 26 October 2018 through 28 October 2018
ER -