Research on model based reliability system engineering methodology of system in package

Yutai Su, Guicui Fu, Ye Wang, Hongyan Leng, Hantian Gu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

With the rapid development of SiP technology, reliability problems on the SiP can not be resolved by single theories and traditional methods. This paper proposed a MBRSE methodology of SiP, describing requirement analysis, design, manufacturing, test and product acceptance of SiP. Some reliability models of SiP were provided as references, including data-driven models and PoF models. Finally, some directions for MBRSE of SiP were recommended to be researched.

Original languageEnglish
Title of host publication2017 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-3
Number of pages3
ISBN (Electronic)9781538612385
DOIs
StatePublished - 2 Jul 2017
Externally publishedYes
Event2017 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2017 - Haining, Zhejiang, China
Duration: 14 Dec 201716 Dec 2017

Publication series

Name2017 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2017
Volume2018-January

Conference

Conference2017 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2017
Country/TerritoryChina
CityHaining, Zhejiang
Period14/12/1716/12/17

Keywords

  • Model Based Reliability System Engineering
  • Reliability Models
  • System in Package

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