Quality monitor in multi-operation machining processes based on wavelet filtering

B. Chen, P. Wang, D. H. Zhang, K. Liu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The method of quality monitor based on wavelet filtering was proposed to solve the problems of quality control in multi-operation manufacturing processes, whose measurement data contained noise information. The multi-operation machining process quality control model based on the Stream of Variation (SoV) technology was built, which considered the error propagation. Based on this, the method of discrete wavelet transformation was adopted to smooth data and to reduce noise, and then control charts were built by the method of T-square control chart to monitor processes. The average run length (ARL) was adopted to verify the performance of the proposed quality control method. A sample application was developed to illustrate the feasibility and validity of the proposed quality monitor method.

Original languageEnglish
Title of host publication2012 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2012
PublisherIEEE Computer Society
Pages2375-2379
Number of pages5
ISBN (Print)9781467329453
DOIs
StatePublished - 2012
Event2012 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2012 - Hong Kong, China
Duration: 10 Dec 201213 Dec 2012

Publication series

NameIEEE International Conference on Industrial Engineering and Engineering Management
ISSN (Print)2157-3611
ISSN (Electronic)2157-362X

Conference

Conference2012 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2012
Country/TerritoryChina
CityHong Kong
Period10/12/1213/12/12

Keywords

  • noise processing
  • Quality control model
  • statistical process control
  • wavelet transformation

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