TY - JOUR
T1 - Quality improvement of CdMnTe:In single crystals by an effective post-growth annealing
AU - Yu, Pengfei
AU - Xu, Yadong
AU - Luan, Lijun
AU - Du, Yuanyuan
AU - Zheng, Jiahong
AU - Li, Hui
AU - Jie, Wanqi
N1 - Publisher Copyright:
© 2016 Elsevier B.V.
PY - 2016/10/1
Y1 - 2016/10/1
N2 - In this paper, an effective annealing method in which CdMnTe:In (CMT:In) single crystals were coated with CMT powders of the same composition was used to improve the crystal quality of CMT:In crystals. The results indicated that the density of Te inclusions decreased as the annealing time increased. The resistivity and IR transmittance of annealed CMT:In crystals were enhanced obviously. The resistivity of 120 h annealed crystal increased even two orders of magnitude. The reduction of full-width at-half-maximum (FWHM) and the increase of the intensity of X-ray rocking curve indicated an improvement of the crystal quality. PL measurements also showed the crystal quality improved after annealing. No characteristic peak of 241Am γ-ray could be observed in the detector fabricated with as-grown crystal. Remarkably, for the detector fabricated with annealed crystals, the peak of 241Am γ-ray appeared. And the energy resolution and μτ value were improved as the annealing time increased. Specially, 120 h annealed CMT:In crystal with 10.11% energy resolution and 1.20×10−3 cm2/V μτ value has the best detector performance.
AB - In this paper, an effective annealing method in which CdMnTe:In (CMT:In) single crystals were coated with CMT powders of the same composition was used to improve the crystal quality of CMT:In crystals. The results indicated that the density of Te inclusions decreased as the annealing time increased. The resistivity and IR transmittance of annealed CMT:In crystals were enhanced obviously. The resistivity of 120 h annealed crystal increased even two orders of magnitude. The reduction of full-width at-half-maximum (FWHM) and the increase of the intensity of X-ray rocking curve indicated an improvement of the crystal quality. PL measurements also showed the crystal quality improved after annealing. No characteristic peak of 241Am γ-ray could be observed in the detector fabricated with as-grown crystal. Remarkably, for the detector fabricated with annealed crystals, the peak of 241Am γ-ray appeared. And the energy resolution and μτ value were improved as the annealing time increased. Specially, 120 h annealed CMT:In crystal with 10.11% energy resolution and 1.20×10−3 cm2/V μτ value has the best detector performance.
KW - A1. Characterization
KW - A2. Bridgman technique
KW - B1. Cadmium compounds
KW - B2 Semiconducting II–VI materials
UR - http://www.scopus.com/inward/record.url?scp=84982719260&partnerID=8YFLogxK
U2 - 10.1016/j.jcrysgro.2016.07.009
DO - 10.1016/j.jcrysgro.2016.07.009
M3 - 文章
AN - SCOPUS:84982719260
SN - 0022-0248
VL - 451
SP - 194
EP - 199
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
ER -