Abstract
We proposed a quantitative method to detect atomic position in atomic intensity images from experiments such as high-resolution transmission electron microscopy, atomic force microscopy, and simulation such as phase field crystal modeling. The evaluation of detection accuracy proves the excellent performance of the method. This method provides a chance to precisely determine atomic interactions based on the detected atomic positions from the atomic intensity image, and hence to investigate the related physical, chemical and electrical properties.
Original language | English |
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Pages (from-to) | 74-78 |
Number of pages | 5 |
Journal | Ultramicroscopy |
Volume | 150 |
DOIs | |
State | Published - 1 Mar 2015 |
Keywords
- Atomic intensity image
- Atomic position
- Strain mapping