Precisely detecting atomic position of atomic intensity images

Zhijun Wang, Yaolin Guo, Sai Tang, Junjie Li, Jincheng Wang, Yaohe Zhou

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We proposed a quantitative method to detect atomic position in atomic intensity images from experiments such as high-resolution transmission electron microscopy, atomic force microscopy, and simulation such as phase field crystal modeling. The evaluation of detection accuracy proves the excellent performance of the method. This method provides a chance to precisely determine atomic interactions based on the detected atomic positions from the atomic intensity image, and hence to investigate the related physical, chemical and electrical properties.

Original languageEnglish
Pages (from-to)74-78
Number of pages5
JournalUltramicroscopy
Volume150
DOIs
StatePublished - 1 Mar 2015

Keywords

  • Atomic intensity image
  • Atomic position
  • Strain mapping

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