TY - JOUR
T1 - Performance measures for systems under multiple environments
AU - Liu, Baoliang
AU - Cui, Lirong
AU - Si, Shubin
AU - Wen, Yanqing
N1 - Publisher Copyright:
© 2014 Chinese Association of Automation.
PY - 2016/1/10
Y1 - 2016/1/10
N2 - In this paper, the system which operates in multiple environments is studied. The environment process is governed by a Markov process, and the deterioration process is governed by another Markov process given the system in a certain environment. In terms of the above two processes, a new Markov process is constructed to represent the evolution of the system. In terms of Ion-Channel modeling theory, Markov process theory and matrix partition method, some reliability indexes for the system are obtained, i.e., system reliability, environment reliability, system multiple-interval reliability, system availability, environment availability, system multiple-point availability, etc. Finally, a numerical example is given to illustrate the results obtained in the paper.
AB - In this paper, the system which operates in multiple environments is studied. The environment process is governed by a Markov process, and the deterioration process is governed by another Markov process given the system in a certain environment. In terms of the above two processes, a new Markov process is constructed to represent the evolution of the system. In terms of Ion-Channel modeling theory, Markov process theory and matrix partition method, some reliability indexes for the system are obtained, i.e., system reliability, environment reliability, system multiple-interval reliability, system availability, environment availability, system multiple-point availability, etc. Finally, a numerical example is given to illustrate the results obtained in the paper.
KW - Markov system
KW - Reliability
KW - availability
KW - interval reliability
UR - http://www.scopus.com/inward/record.url?scp=84964739615&partnerID=8YFLogxK
U2 - 10.1109/JAS.2016.7373757
DO - 10.1109/JAS.2016.7373757
M3 - 文章
AN - SCOPUS:84964739615
SN - 2329-9266
VL - 3
SP - 90
EP - 95
JO - IEEE/CAA Journal of Automatica Sinica
JF - IEEE/CAA Journal of Automatica Sinica
IS - 1
M1 - 7373766
ER -