On the poisoning effect of O 2 and N 2 for the Zr 0.9Ti 0.1V 2 hydrogen storage alloy

T. B. Zhang, X. W. Yang, J. S. Li, R. Hu, X. Y. Xue, H. Z. Fu

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Abstract

Homogeneously annealed Zr 0.9Ti 0.1V 2 samples are firstly exposed to contamination gases of O 2 and N 2 for 30, 60 and 180 s at the ambient temperature, respectively. Hydrogen absorption properties are examined after poisoning and regeneration. The compositions and valence in the surface and sub-surface are investigated by X-ray photoelectron spectroscopy (XPS). The hydrogen absorption capacity of the alloy has been almost entirely degraded by the oxygen poisoning. After the regeneration, the oxygen-poisoned sample can hardly absorb hydrogen while the nitrogen-poisoned sample re-obtains the hydrogen absorption capacity with the value as 2.85 H A -1 (molar ratio of hydrogen to alloy). The activation temperature of the oxygen-poisoned sample is ∼100 K higher than the value of the un-poisoned one. With the help of ion etching, it is found the thickness of the passivated surface layer of the oxygen-poisoned sample was ∼58 nm. However, the thickness of the passivated surface layer of the un-poisoned sample is only ∼36 nm. That is the reason why the oxygen-poisoned sample cannot renew the hydrogen absorption capacity under the same regeneration conditions as in the un-poisoned one.

Original languageEnglish
Pages (from-to)217-224
Number of pages8
JournalJournal of Power Sources
Volume202
DOIs
StatePublished - 15 Mar 2012

Keywords

  • Gaseous impurities
  • Hydrogen absorption
  • Poison
  • Regeneration
  • XPS

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