Observations on nanoscale te precipitates in CdZnTe crystals grown by the traveling heater method using high resolution transmission electron microscopy

Boru Zhou; Wanqi Jie; Tao Wang; Zongde Kou; Dou Zhao; Liying Yin; Fan Yang; Shouzhi Xi; Gangqiang Zha; Ziang Yin

doi:10.3390/cryst8010026

Observations on nanoscale te precipitates in CdZnTe crystals grown by the traveling heater method using high resolution transmission electron microscopy

Boru Zhou, Wanqi Jie, Tao Wang, Zongde Kou, Dou Zhao, Liying Yin, Fan Yang, Shouzhi Xi, Gangqiang Zha, Ziang Yin

School of Materials Sience and Engineering

Northwestern Polytechnical University Xian

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown CZT. They have hexagonal structure and form a coherent interface with zinc blend structure CZT matrix in the orientation relationship [112]_M// [0001]_P and (111)_M// (1100)_P. A ledge growth interface with the preferred orientation along the [111]_M and [110]_M was found near Te precipitates. The growth and nucleation mechanism of Te precipitates are also discussed.

Original language	English
Article number	26
Journal	Crystals
Volume	8
Issue number	1
DOIs	https://doi.org/10.3390/cryst8010026
State	Published - 10 Jan 2018

Keywords

CdZnTe
Defects in semiconductors
Interface structure
Precipitation
Transmission electron microscopy (TEM)
Traveling heater method

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10.3390/cryst8010026

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title = "Observations on nanoscale te precipitates in CdZnTe crystals grown by the traveling heater method using high resolution transmission electron microscopy",

abstract = "Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown CZT. They have hexagonal structure and form a coherent interface with zinc blend structure CZT matrix in the orientation relationship [112]M// [0001]P and (111)M// (1100)P. A ledge growth interface with the preferred orientation along the [111]M and [110]M was found near Te precipitates. The growth and nucleation mechanism of Te precipitates are also discussed.",

keywords = "CdZnTe, Defects in semiconductors, Interface structure, Precipitation, Transmission electron microscopy (TEM), Traveling heater method",

author = "Boru Zhou and Wanqi Jie and Tao Wang and Zongde Kou and Dou Zhao and Liying Yin and Fan Yang and Shouzhi Xi and Gangqiang Zha and Ziang Yin",

note = "Publisher Copyright: {\textcopyright} 2018 by the authors. Licensee MDPI, Basel, Switzerland.",

year = "2018",

month = jan,

day = "10",

doi = "10.3390/cryst8010026",

language = "英语",

volume = "8",

journal = "Crystals",

issn = "2073-4352",

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TY - JOUR

T1 - Observations on nanoscale te precipitates in CdZnTe crystals grown by the traveling heater method using high resolution transmission electron microscopy

AU - Zhou, Boru

AU - Jie, Wanqi

AU - Wang, Tao

AU - Kou, Zongde

AU - Zhao, Dou

AU - Yin, Liying

AU - Yang, Fan

AU - Xi, Shouzhi

AU - Zha, Gangqiang

AU - Yin, Ziang

PY - 2018/1/10

Y1 - 2018/1/10

N2 - Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown CZT. They have hexagonal structure and form a coherent interface with zinc blend structure CZT matrix in the orientation relationship [112]M// [0001]P and (111)M// (1100)P. A ledge growth interface with the preferred orientation along the [111]M and [110]M was found near Te precipitates. The growth and nucleation mechanism of Te precipitates are also discussed.

AB - Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown CZT. They have hexagonal structure and form a coherent interface with zinc blend structure CZT matrix in the orientation relationship [112]M// [0001]P and (111)M// (1100)P. A ledge growth interface with the preferred orientation along the [111]M and [110]M was found near Te precipitates. The growth and nucleation mechanism of Te precipitates are also discussed.

KW - CdZnTe

KW - Defects in semiconductors

KW - Interface structure

KW - Precipitation

KW - Transmission electron microscopy (TEM)

KW - Traveling heater method

UR - http://www.scopus.com/inward/record.url?scp=85040972727&partnerID=8YFLogxK

U2 - 10.3390/cryst8010026

DO - 10.3390/cryst8010026

M3 - 文章

AN - SCOPUS:85040972727

SN - 2073-4352

VL - 8

JO - Crystals

JF - Crystals

IS - 1

M1 - 26

ER -

Observations on nanoscale te precipitates in CdZnTe crystals grown by the traveling heater method using high resolution transmission electron microscopy

Abstract

Keywords

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