Nonuniformity characterization and correction of MOS resistor array

Kai Zhang, Yong Huang, Li Sun, Jie Yan

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

In the full paper, we explain in detail our research results on nonuniformity characterization and correction of MOS resistor array; in this abstract, we just add some pertinent remarks to the two topics of explanation: (1) the causes and characteristics of nonuniformity of infrared images of MOS resistor array and (2) the nonuniformity measurement and compensation algorithm of MOS resistor array; in topic 1, we find that the main causes of the nonuniformity are the nonlinearity of the resistor array and the nonuniformity of background voltage; in topic 2, we measure voltage vs temperature curves by testing MOS resistor array offline and then establish their compensation table (Table 1 in the full paper), whereby each resistor in MOS resistor array can be corrected in real-time so that its gray degree can match the corresponding datum in Tablel; also in topic 2, we generate the voltage vs temperature curve for each resistor in the array (a typical curve is shown in Fig 4 in the full paper). Our approach was adopted in a real IR scene projector based on MOS resistor array and the user expresssed satisfaction.

Original languageEnglish
Pages (from-to)108-112
Number of pages5
JournalXibei Gongye Daxue Xuebao/Journal of Northwestern Polytechnical University
Volume25
Issue number1
StatePublished - Feb 2007

Keywords

  • Infrared scene projector
  • MOS resistor array
  • Nonuniformity correction

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