Near-field imaging using digital holographic interferometry with total internal reflection and surface plasma resonance

Jianlin Zhao, Jiwei Zhang, Jianglei Di, Siqing Dai, Chaojie Ma, Teli Xi, Ying Li

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Near-field refractive index and film thickness on prism or metal surface can be determined, by measuring the complex amplitude distributions of reflected light in total internal reflection and surface plasma resonance using digital holographic interferometry.

Original languageEnglish
Title of host publicationDigital Holography and Three-Dimensional Imaging, DH 2018
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580446
DOIs
StatePublished - 2018
EventDigital Holography and Three-Dimensional Imaging, DH 2018 - Orlando, United States
Duration: 25 Jun 201828 Jun 2018

Publication series

NameOptics InfoBase Conference Papers
VolumePart F100-DH 2018
ISSN (Electronic)2162-2701

Conference

ConferenceDigital Holography and Three-Dimensional Imaging, DH 2018
Country/TerritoryUnited States
CityOrlando
Period25/06/1828/06/18

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