Morphology and crystalline phase characteristics of α-GST films irradiated by a picosecond laser

J. J. Zhao, F. R. Liu, X. X. Han, N. Bai, Y. H. Wan, X. Lin, F. Liu

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

The morphology and crystalline phase characteristics of amorphous Ge 2 Sb 2 Te 5 films irradiated by a picosecond laser were investigated by 3D surface profiler, atomic force microscopy (AFM) and transmission electron microscopy (TEM) integrated with selected area electron diffraction (SAED). The laser irradiated spot was divided into strong ablation area, gentle ablation area, melting area and irradiation area. By theoretical calculation, the ablation and melting thresholds were determined to be 173.05 mJ cm -2 and 99.19 mJ cm -2 respectively. Meantime, the local fine morphologies of the ablation and melting areas were shown and analyzed. We also studied the irradiation area which was made up by the non-phase-change area and phase-change area. In the phase-change area, crystalline phase was determined to be face-centered cubic structure and crystalline phase characteristics for films with different thicknesses were discussed.

Original languageEnglish
Pages (from-to)160-166
Number of pages7
JournalApplied Surface Science
Volume289
DOIs
StatePublished - 15 Jan 2014

Keywords

  • Morphology
  • Phase change
  • Picosecond laser

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