Modification of growth interface of CdZnTe crystals in THM process by ACRT

The accelerated crucible rotation technique (ACRT) was introduced in the traveling heater method (THM) growth process of detector-grade CdZnTe (CZT) crystals to regulate the convection in the melt and to modify the growth interface morphology. Several ingots with the diameter of 53 mm were grown by THM with/without ACRT. The ingots were quenched during the growth to show both macroscopic and microscopic morphologies of the growth interfaces. The results show that by using ACRT the growth interface can be changed from a concave one to the flat or even convex one depending on the ACRT parameters, which is favorable for reducing nucleation in the melt to get larger CZT grains. Meanwhile, by using ACRT in THM process, the microscopic interface was changed from a diffused one to cellular or even planar one (at suitable ACRT parameters), through which the trapped Te inclusions was decreased for one order. An ingot grown by THM with constant rotation rate of 40 rpm was also grown, which have also reduced the interface curvature in macro-scale and Te inclusions to some extent, but the effects are not as significant as ACRT with high crucible rotation rate.