Abstract
Influence of 30 kilo-electron-volt (keV) Argon (Ar+) ions on optical and electrical properties of nickel nanowires (Ni-NWs) meshes is being reported. Ni-NWs are being exposed to 30 keV Argon (Ar+) ions at various beam fluencies. These fluencies of Ar+ ions are 7 × 1014 ions cm-2, 3 × 1015 ions cm-2 and 3 × 1016 ions cm-2. After irradiation, Ni-NWs meshes were analyzed through transmission electron microscopy technique (TEM). The structural analysis has been done through X-ray diffraction technique. It is found from TEM results that atoms are sputtered out from surfaces of Ni-NWs due to collision cascade effect persistently and lead to reduce the diameters or thicknesses of Ni-NWs. X-ray diffraction results reveal that crystalline quality is reduced under Ar+ ions irradiation which may be due to defects induced in Ni-NWs as a result of collision cascade effect. The Ni-NWs meshes are characterized optically and electrically through UV-VIS spectroscopy and four probe techniques. The optical transparencies of Ni-NWs meshes are increasing with increase in beam fluence of Ar+ ions. The electrical conductivity of the mesh is decreased continuously with increment in beam fluence of Ar+ ions which might be due to production of defects in Ni-NWs. The tuning of optical transparency and electrical conductivity of Ni-NWs meshes is required for their application as successful transparent electrodes in optoelectronic nanodevices.
Original language | English |
---|---|
Article number | 065008 |
Journal | Materials Research Express |
Volume | 7 |
Issue number | 6 |
DOIs | |
State | Published - Jun 2020 |
Keywords
- Argon Ions (Ar)
- Irradiation
- Nickel Nanowires
- Optical, Electrical
- TEM
- XRD