Microstructure evolutions and electrical properties of Pb1-xLax(Zr0.56Ti0.44)1-x/4O3 ceramics

Bo Tang, Huiqing Fan, Shanming Ke, Laijun Liu

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7 Scopus citations

Abstract

Microstructure evolutions and electrical properties of Pb1-xLax(Zr0.56Ti0.44)1-x/4O3 (x = 0.02, 0.04, 0.06, 0.08, 0.10, 0.12, 0.125) ceramics with the increasing of La content have been investigated. The series compositions have been chosen because these compositions are across the economically important morphotropic phase boundary (MPB) area in the phase diagram of the PLZT solid-solution system. The samples have been prepared by a conventional mixed oxide method followed by sintering in PbZrO3 powder under air atmosphere, so that A-site vacancies have been obtained mostly. Then X-ray diffraction investigation, microstructure, dielectric properties of the ceramics are carried out. For all sets of samples the variation of La content induces changes in the physical properties. Otherwise, the mechanism of the microstructure evolutions of PLZT ceramics has been discussed.

Original languageEnglish
Pages (from-to)205-209
Number of pages5
JournalMaterials Science and Engineering: B
Volume138
Issue number3
DOIs
StatePublished - 15 Apr 2007

Keywords

  • Electrical properties
  • Microstructure evolutions
  • Morphotropic phase boundary (MPB)
  • PbLa(ZrTi)O

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