Microstructure evolution and room temperature fracture toughness of an integrally directionally solidified Nb-Ti-Si based ultrahigh temperature alloy

Haisheng Guo, Xiping Guo

Research output: Contribution to journalArticlepeer-review

124 Scopus citations

Abstract

Integrally directional solidification of an Nb-Ti-Si based ultrahigh temperature alloy was performed at 2000 °C with withdrawal rates varying from 2.5 to 100 μm s-1. The directionally solidified microstructure was composed of primary silicides and eutectic colonies that distributed evenly and aligned erectly along the growth direction. Both the average diameter and the lamellar spacing of eutectic cells decreased with increasing withdrawal rate. The room temperature fracture toughness was improved significantly by integrally directional solidification.

Original languageEnglish
Pages (from-to)637-640
Number of pages4
JournalScripta Materialia
Volume64
Issue number7
DOIs
StatePublished - Apr 2011

Keywords

  • Directional solidification
  • Fracture toughness
  • Nb-Ti-Si based alloy
  • Solidification microstructure

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