Microstructure and properties of Si-TaSi2 eutectic in situ composite for field emission

Chun Juan Cui, Jun Zhang, Min Han, Jun Chen, Ning Sheng Xu, Lin Liu, Heng Zhi Fu

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The Si-TaSi2 eutectic in situ composite for field emission is prepared by electron beam floating zone melting (EBFZM) technique on the basis of Czochralski (CZ) crystal growth technique. The directional solidification microstructure and the field emission properties of the Si-TaSi2 eutectic in situ composite prepared by two kinds of crystal growth techniques have been systematically tested and compared. Researches demonstrated that the solidification microstructure of EBFZM can be fined obviously because of the relatively high solidification rate and very high temperature gradient, i.e. both the diameter and inter-rod spacing of the TaSi2 fibers prepared by EBFZM technique were decreased, and the density and the volume fraction of the TaSi2 fibers prepared by EBFZM technique were increased in comparison with that of the TaSi2 fibers prepared by CZ method. Therefore the field emission property of the Si-TaSi2 eutectic in situ composite prepared by EBFZM can be improved greatly, which exhibits better field emission uniformity and straighter F-N curve.

Original languageEnglish
Pages (from-to)984-989
Number of pages6
JournalChinese Science Bulletin
Volume52
Issue number7
DOIs
StatePublished - Apr 2007

Keywords

  • Czochralski method
  • Direction solidification
  • Electron beam floating zone melting
  • Field emission

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