Micromorphology analysis of Sn-3.0Ag-0.5Cu solder under compression in wide ranges of temperature and strain rate

Junmeng Xu, Chuantong Chen, Xu Long

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

The microstructure and mechanical properties of Sn-3.0Ag-0.5Cu (SAC305) under different working conditions were studied by static compression tests. The constitutive behaviour of SAC305 material with wide ranges of temperature and strain rate was obtained and correlated with the micromorphology on the specimen surface in this paper. With the temperature varies, the micromorphology of the solder specimens changed significantly. Specifically, as the temperature increases, more compression fringes along the loading direction appeared on the surface of the specimen, and the length of the fringes was elongated. Moreover, the mechanical properties of the solder showed obvious softening phenomenon, that is, the compressive strength decreased gradually. With the increase of the loading strain rate, the micromorphology showed the opposite evolution law compared with the consequences when the temperature increases. That is, the compression fringes gradually decrease and shorten, and the strength increased continuously, which shows an obvious hardening phenomenon. Under the condition of high temperature and low strain rate, a macro crack with the degree of 45° with respect to the compression axis can also be found on the surface of static compression specimen, and its length and width changed regularly with temperature and strain rate.

Original languageEnglish
Title of host publication2020 IEEE 22nd Electronics Packaging Technology Conference, EPTC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages312-315
Number of pages4
ISBN (Electronic)9781728189116
DOIs
StatePublished - 2 Dec 2020
Event22nd IEEE Electronics Packaging Technology Conference, EPTC 2020 - Virtual, Singapore, Singapore
Duration: 2 Dec 20204 Dec 2020

Publication series

Name2020 IEEE 22nd Electronics Packaging Technology Conference, EPTC 2020

Conference

Conference22nd IEEE Electronics Packaging Technology Conference, EPTC 2020
Country/TerritorySingapore
CityVirtual, Singapore
Period2/12/204/12/20

Keywords

  • Compression
  • Mechanical property
  • Micromorphology
  • Solder

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