Abstract
Aiming for solving the problem of the bad pixels detection precision of infrared system, a new detection method is proposed, which combine "3σ" principle with wavelet filtering. This method pretreats the noise image with wavelet transform firstly, then detects bad pixels with "3σ" principle. Simulation results show that the influence of noise for bad pixel detection has been eliminated and the low detection precision of "3σ" principle has been improved effectively.
| Original language | English |
|---|---|
| Pages (from-to) | 453-456 |
| Number of pages | 4 |
| Journal | Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering |
| Volume | 36 |
| Issue number | 4 |
| State | Published - Aug 2007 |
Keywords
- "3σ"
- Bad pixels
- Infrared focal plane array
- Non-uniformity
- Principe
- Stripe noise
- Wavelet filtering