Matching Words for Out-of-distribution Detection

Keke Tang, Xujian Cai, Weilong Peng, Daizong Liu, Peican Zhu, Pan Zhou, Zhihong Tian, Wenping Wang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Deep neural networks often exhibit the overconfidence issue when encountering out-of-distribution (OOD) samples. To address this, leveraging large-scale pre-trained models like CLIP has shown promise. While CLIP has the capability to encode a vast array of interconnected concepts, current OOD detection methods based on it primarily focus on ID categories and a limited set of OOD categories. In this paper, we propose a novel approach that harnesses the power of WordNet to fully exploit the rich knowledge encapsulated within CLIP, resulting in enhanced OOD detection performance. Our methodology involves constructing a word tree that includes both in-distribution (ID) words and a large set of semantically similar OOD words selected from WordNet. By matching a test image with the concepts of the words in the word tree using CLIP, we estimate the probability of the image being classified as either ID or OOD. Furthermore, we introduce a conditional random field model to effectively handle both the parent-child and the sibling-sibling conflicts in the concept matching results. Extensive experiments under various ID/OOD settings demonstrate the effectiveness of our approach and its superiority over state-of-the-art methods.

Original languageEnglish
Title of host publicationProceedings - 23rd IEEE International Conference on Data Mining, ICDM 2023
EditorsGuihai Chen, Latifur Khan, Xiaofeng Gao, Meikang Qiu, Witold Pedrycz, Xindong Wu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages578-587
Number of pages10
ISBN (Electronic)9798350307887
DOIs
StatePublished - 2023
Event23rd IEEE International Conference on Data Mining, ICDM 2023 - Shanghai, China
Duration: 1 Dec 20234 Dec 2023

Publication series

NameProceedings - IEEE International Conference on Data Mining, ICDM
ISSN (Print)1550-4786

Conference

Conference23rd IEEE International Conference on Data Mining, ICDM 2023
Country/TerritoryChina
CityShanghai
Period1/12/234/12/23

Keywords

  • CLIP
  • Concept matching
  • OOD de-tection
  • Out-of-distribution
  • WordNet

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