Investigation of effective annealing on CdMnTe:In crystals with different thickness for gamma-ray detectors

Pengfei Yu, Yadong Xu, Yongren Chen, Jie Song, Yi Zhu, Meijing Zhang, Binggang Zhang, Yu Wang, Wei Li, Lijun Luan, Yuanyuan Du, Jing Ma, Jiahong Zheng, Zhuo Li, Min Bai, Hui Li, Wanqi Jie

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

Radiation detectors with different thickness are needed to detect gamma rays with various energies. In this paper, a post-growth annealing method was used to improve the properties of CdMnTe:In (CMT:In) crystals with different thickness for gamma-ray detectors. The results indicated that Te inclusions in CMT:In crystals with different thickness were reduced remarkably after annealing. Both the resistivity and IR transmittance of annealed CMT:In crystals with different thickness increased obviously, which suggested that the crystal quality was improved. For the detectors fabricated by annealed CMT:In slices with 1 mm, 2 mm and 5 mm thickness, the energy resolutions were enhanced about 252%, 193% and 141%, respectively. And (μτ)e values were enhanced about 80%, 80% and 76%, respectively. The performance of the detectors was greatly improved after annealing.

Original languageEnglish
Pages (from-to)94-101
Number of pages8
JournalJournal of Crystal Growth
Volume483
DOIs
StatePublished - 1 Feb 2018

Keywords

  • A1. Characterization
  • A2. Bridgman technique
  • B1. Cadmium compounds
  • B2 Semiconducting II–VI materials

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