Infrared transmission spectra of Cd1-xZnxTe (x = 0.04) crystals

Li Yujie; Gu Zhi; Li Guoqiang; Jie Wanqi

doi:10.1007/s11664-004-0212-9

Infrared transmission spectra of Cd_1-xZn_xTe (x = 0.04) crystals

Li Yujie, Gu Zhi, Li Guoqiang, Jie Wanqi

School of Materials Sience and Engineering

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

Three indicators (T₁₀₀₀, T₅₀₀₀, and T ₁₀₀₀/T₅₀₀₀) are used to appraise the infrared (IR) transmission spectra for Cd_1-xZn_xTe (CZT) slices. By comparing the values of these three indicators, four typical types of IR spectra are characterized for CZT crystals. The CZT crystals possessing the four types of IR spectra are different in microstructures, especially the densities and sizes of Te precipitates, the free carrier concentrations, and the resistivities. Mechanisms for the elimination of tiny and dense Te precipitates are given by analyzing the variation of the IR transmittance in the range of 500-5000 cm^-1 during the annealing process.

Original language	English
Pages (from-to)	861-866
Number of pages	6
Journal	Journal of Electronic Materials
Volume	33
Issue number	8
DOIs	https://doi.org/10.1007/s11664-004-0212-9
State	Published - Aug 2004

Keywords

Annealing
CdZnTe (CZT)
IR transmittance
Te precipitates
The free carrier scattering effect

Access to Document

10.1007/s11664-004-0212-9

Cite this

@article{4b21108cec334e80b33c0423572394cd,

title = "Infrared transmission spectra of Cd1-xZnxTe (x = 0.04) crystals",

abstract = "Three indicators (T1000, T5000, and T 1000/T5000) are used to appraise the infrared (IR) transmission spectra for Cd1-xZnxTe (CZT) slices. By comparing the values of these three indicators, four typical types of IR spectra are characterized for CZT crystals. The CZT crystals possessing the four types of IR spectra are different in microstructures, especially the densities and sizes of Te precipitates, the free carrier concentrations, and the resistivities. Mechanisms for the elimination of tiny and dense Te precipitates are given by analyzing the variation of the IR transmittance in the range of 500-5000 cm-1 during the annealing process.",

keywords = "Annealing, CdZnTe (CZT), IR transmittance, Te precipitates, The free carrier scattering effect",

author = "Li Yujie and Gu Zhi and Li Guoqiang and Jie Wanqi",

year = "2004",

month = aug,

doi = "10.1007/s11664-004-0212-9",

language = "英语",

volume = "33",

pages = "861--866",

journal = "Journal of Electronic Materials",

issn = "0361-5235",

publisher = "Springer New York",

number = "8",

}

TY - JOUR

T1 - Infrared transmission spectra of Cd1-xZnxTe (x = 0.04) crystals

AU - Yujie, Li

AU - Zhi, Gu

AU - Guoqiang, Li

AU - Wanqi, Jie

PY - 2004/8

Y1 - 2004/8

N2 - Three indicators (T1000, T5000, and T 1000/T5000) are used to appraise the infrared (IR) transmission spectra for Cd1-xZnxTe (CZT) slices. By comparing the values of these three indicators, four typical types of IR spectra are characterized for CZT crystals. The CZT crystals possessing the four types of IR spectra are different in microstructures, especially the densities and sizes of Te precipitates, the free carrier concentrations, and the resistivities. Mechanisms for the elimination of tiny and dense Te precipitates are given by analyzing the variation of the IR transmittance in the range of 500-5000 cm-1 during the annealing process.

AB - Three indicators (T1000, T5000, and T 1000/T5000) are used to appraise the infrared (IR) transmission spectra for Cd1-xZnxTe (CZT) slices. By comparing the values of these three indicators, four typical types of IR spectra are characterized for CZT crystals. The CZT crystals possessing the four types of IR spectra are different in microstructures, especially the densities and sizes of Te precipitates, the free carrier concentrations, and the resistivities. Mechanisms for the elimination of tiny and dense Te precipitates are given by analyzing the variation of the IR transmittance in the range of 500-5000 cm-1 during the annealing process.

KW - Annealing

KW - CdZnTe (CZT)

KW - IR transmittance

KW - Te precipitates

KW - The free carrier scattering effect

UR - http://www.scopus.com/inward/record.url?scp=4043140617&partnerID=8YFLogxK

U2 - 10.1007/s11664-004-0212-9

DO - 10.1007/s11664-004-0212-9

M3 - 文章

AN - SCOPUS:4043140617

SN - 0361-5235

VL - 33

SP - 861

EP - 866

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 8

ER -

Infrared transmission spectra of Cd_1-xZn_xTe (x = 0.04) crystals

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this