Influence of process conditions on lattice parameter of high textured YBa2Cu3O7 thick films

Chunfang Liu; Hui Tang; Jingren Xu; Lian Zhou

Influence of process conditions on lattice parameter of high textured YBa₂Cu₃O₇ thick films

Chunfang Liu, Hui Tang, Jingren Xu, Lian Zhou

Research

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The lattice parameter c of highly textured YBCO thick films were calculated using X-ray diffraction dual-line method. The lattice parameters of samples prepared on Ni substrate were rather smaller than those of sintered samples and thick films prepared on Ag-Pd substrate. Increasing the substrate temperature during spraying, the sintering temperature after spraying, and the moving speed of samples during zone melting all make lattice parameter c decrease. The samples which have higher T_c generally have rather smaller lattice parameter c.

Original language	English
Pages (from-to)	26-30
Number of pages	5
Journal	Xiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering
Volume	23
Issue number	1
State	Published - Feb 1994
Externally published	Yes

Cite this

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title = "Influence of process conditions on lattice parameter of high textured YBa2Cu3O7 thick films",

abstract = "The lattice parameter c of highly textured YBCO thick films were calculated using X-ray diffraction dual-line method. The lattice parameters of samples prepared on Ni substrate were rather smaller than those of sintered samples and thick films prepared on Ag-Pd substrate. Increasing the substrate temperature during spraying, the sintering temperature after spraying, and the moving speed of samples during zone melting all make lattice parameter c decrease. The samples which have higher Tc generally have rather smaller lattice parameter c.",

author = "Chunfang Liu and Hui Tang and Jingren Xu and Lian Zhou",

year = "1994",

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AU - Liu, Chunfang

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AU - Xu, Jingren

AU - Zhou, Lian

PY - 1994/2

Y1 - 1994/2

N2 - The lattice parameter c of highly textured YBCO thick films were calculated using X-ray diffraction dual-line method. The lattice parameters of samples prepared on Ni substrate were rather smaller than those of sintered samples and thick films prepared on Ag-Pd substrate. Increasing the substrate temperature during spraying, the sintering temperature after spraying, and the moving speed of samples during zone melting all make lattice parameter c decrease. The samples which have higher Tc generally have rather smaller lattice parameter c.

AB - The lattice parameter c of highly textured YBCO thick films were calculated using X-ray diffraction dual-line method. The lattice parameters of samples prepared on Ni substrate were rather smaller than those of sintered samples and thick films prepared on Ag-Pd substrate. Increasing the substrate temperature during spraying, the sintering temperature after spraying, and the moving speed of samples during zone melting all make lattice parameter c decrease. The samples which have higher Tc generally have rather smaller lattice parameter c.

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AN - SCOPUS:0028368570

SN - 1002-185X

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JO - Xiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering

JF - Xiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering

IS - 1

ER -

Influence of process conditions on lattice parameter of high textured YBa₂Cu₃O₇ thick films

Abstract

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