Human Cognitive Reliability and R&D Efficiency: A Human Factor Study in Semiconductor Pilot Scale Production Line

Yuanjun Li, Mengya Zhu, Dengkai Chen, Yiting Yu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A qualified chip sensor determined for mass production must undergo rigorous development and verification on the pilot line. In this experimental process, the sensor performance, quality, and R&D efficiency deeply impact the subsequent progress in the industry. Most pilot lines rely on human(engineers)-machines collaboration because the full-automatic production line requires extremely high investment and does not meet the demand for flexible technique adjustments. Therefore, the operational differences of individual engineers will directly affect the product’s qualification rate. It requires the Process Design/Integration Engineers (PIE, as a manager role of the fab) to update the process flow or management strategies to improve the operator’s performance and reduce human error probability, thus lowering the time and economic cost. For exploratory purposes, this study investigated three Semiconductor pilot scale production lines and interviewed 17 participants with multiple roles in the fab. It summarized 10 Common Performance Conditions and the related secondary index for operators’ performance evaluation and discussed its results in relation to potential human reliability errors.

Original languageEnglish
Title of host publicationEngineering Psychology and Cognitive Ergonomics - 21st International Conference, EPCE 2024, Held as Part of the 26th HCI International Conference, HCII 2024, Proceedings
EditorsDon Harris, Wen-Chin Li
PublisherSpringer Science and Business Media Deutschland GmbH
Pages223-242
Number of pages20
ISBN (Print)9783031607301
DOIs
StatePublished - 2024
Event21st International Conference on Engineering Psychology and Cognitive Ergonomics, EPCE 2024, held as part of the 26th HCI International Conference, HCII 2024 - Washington, United States
Duration: 29 Jun 20244 Jul 2024

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume14693 LNAI
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference21st International Conference on Engineering Psychology and Cognitive Ergonomics, EPCE 2024, held as part of the 26th HCI International Conference, HCII 2024
Country/TerritoryUnited States
CityWashington
Period29/06/244/07/24

Keywords

  • Human Cognitive Reliability
  • Human Factor
  • Semiconductor Production

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