High-quality GaSe single crystal grown by the Bridgman method

Tao Wang, Jie Li, Qinghua Zhao, Ziang Yin, Yinghan Zhang, Bingqi Chen, Yong Xie, Wanqi Jie

Research output: Contribution to journalArticlepeer-review

28 Scopus citations

Abstract

A high-quality GaSe single crystal was grown by the Bridgman method. The X-ray rocking curve for the studied GaSe sample is symmetric and the FullWidth at Half Maximum (FWHM) is only 46 arcs, which is the smallest value ever reported for GaSe crystals. The IR-transmittance is about 66% in the range from 500 to 4000 cm-1. The photoluminescence spectrum at 9.2 K shows a symmetric and sharp excition peak in 2.1046 eV. The results indicate that the as-grown GaSe crystal is of high crystalline quality. The as-grown "-GaSe crystal has a p-type conductance with the resistivity of 103 Ω/cm, and the Hall mobility is ~25 cm2 V-1 s-1. Few-layer GaSe crystals were prepared through mechanical exfoliation from this high-quality crystal sample. Few-layer GaSe-based photodetectors were fabricated, which exhibit an on/offratio of 104, a field-effect differential mobility of 0.4 cm2 V-1 s-1, and have a fast response time less than 60 ms under light illumination.

Original languageEnglish
Article number186
JournalMaterials
Volume11
Issue number2
DOIs
StatePublished - 24 Jan 2018

Keywords

  • Crystalline quality
  • Photodetector
  • Two-dimensional materials
  • ε-GaSe

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