FPGA testing points optimization method based on important analysis

Guochang Zhou; Xiang Gao; Xiaoling Lai; Qi Zhu; Ting Ju; Yangming Guo; Hao Wu; Qiang Zhi

doi:10.1109/PHM.2016.7819773

FPGA testing points optimization method based on important analysis

Guochang Zhou, Xiang Gao, Xiaoling Lai, Qi Zhu, Ting Ju, Yangming Guo, Hao Wu, Qiang Zhi

School of Cybersecurity

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

From the space and time dimension, the FPGA circuit is devised some levels with 'computing unit + memory/register' via analyzing the characteristics of the FPGA circuit. Combined with the location importance, the connection degree among the nodes and their own soft error probability, an importance analysis model is proposed. And then the testing points are optimized based on the importance of each node using the proposed importance analysis model. The test results indicate that the method is a feasible optimization method.

Original language	English
Title of host publication	Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016
Editors	Qiang Miao, Zhaojun Li, Ming J. Zuo, Liudong Xing, Zhigang Tian
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781509027781
DOIs	https://doi.org/10.1109/PHM.2016.7819773
State	Published - 16 Jan 2017
Event	7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 - Chengdu, Sichuan, China Duration: 19 Oct 2016 → 21 Oct 2016

Publication series

Name	Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

Conference

Conference	7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016
Country/Territory	China
City	Chengdu, Sichuan
Period	19/10/16 → 21/10/16

Keywords

FPGA
Important analysis
Optimization
Soft error of single event effect
Testing points

Access to Document

10.1109/PHM.2016.7819773

Cite this

Zhou, G., Gao, X., Lai, X., Zhu, Q., Ju, T., Guo, Y., Wu, H., & Zhi, Q. (2017). FPGA testing points optimization method based on important analysis. In Q. Miao, Z. Li, M. J. Zuo, L. Xing, & Z. Tian (Eds.), Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016 Article 7819773 (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PHM.2016.7819773

Zhou, Guochang ; Gao, Xiang ; Lai, Xiaoling et al. / FPGA testing points optimization method based on important analysis. Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016. editor / Qiang Miao ; Zhaojun Li ; Ming J. Zuo ; Liudong Xing ; Zhigang Tian. Institute of Electrical and Electronics Engineers Inc., 2017. (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016).

@inproceedings{0716debee1fa4bc68efc2a756179dc48,

title = "FPGA testing points optimization method based on important analysis",

abstract = "From the space and time dimension, the FPGA circuit is devised some levels with 'computing unit + memory/register' via analyzing the characteristics of the FPGA circuit. Combined with the location importance, the connection degree among the nodes and their own soft error probability, an importance analysis model is proposed. And then the testing points are optimized based on the importance of each node using the proposed importance analysis model. The test results indicate that the method is a feasible optimization method.",

keywords = "FPGA, Important analysis, Optimization, Soft error of single event effect, Testing points",

author = "Guochang Zhou and Xiang Gao and Xiaoling Lai and Qi Zhu and Ting Ju and Yangming Guo and Hao Wu and Qiang Zhi",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 ; Conference date: 19-10-2016 Through 21-10-2016",

year = "2017",

month = jan,

day = "16",

doi = "10.1109/PHM.2016.7819773",

language = "英语",

series = "Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

editor = "Qiang Miao and Zhaojun Li and Zuo, {Ming J.} and Liudong Xing and Zhigang Tian",

booktitle = "Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016",

}

Zhou, G, Gao, X, Lai, X, Zhu, Q, Ju, T, Guo, Y, Wu, H & Zhi, Q 2017, FPGA testing points optimization method based on important analysis. in Q Miao, Z Li, MJ Zuo, L Xing & Z Tian (eds), Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016., 7819773, Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016, Institute of Electrical and Electronics Engineers Inc., 7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016, Chengdu, Sichuan, China, 19/10/16. https://doi.org/10.1109/PHM.2016.7819773

FPGA testing points optimization method based on important analysis. / Zhou, Guochang; Gao, Xiang; Lai, Xiaoling et al.
Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016. ed. / Qiang Miao; Zhaojun Li; Ming J. Zuo; Liudong Xing; Zhigang Tian. Institute of Electrical and Electronics Engineers Inc., 2017. 7819773 (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - FPGA testing points optimization method based on important analysis

AU - Zhou, Guochang

AU - Gao, Xiang

AU - Lai, Xiaoling

AU - Zhu, Qi

AU - Ju, Ting

AU - Guo, Yangming

AU - Wu, Hao

AU - Zhi, Qiang

PY - 2017/1/16

Y1 - 2017/1/16

N2 - From the space and time dimension, the FPGA circuit is devised some levels with 'computing unit + memory/register' via analyzing the characteristics of the FPGA circuit. Combined with the location importance, the connection degree among the nodes and their own soft error probability, an importance analysis model is proposed. And then the testing points are optimized based on the importance of each node using the proposed importance analysis model. The test results indicate that the method is a feasible optimization method.

AB - From the space and time dimension, the FPGA circuit is devised some levels with 'computing unit + memory/register' via analyzing the characteristics of the FPGA circuit. Combined with the location importance, the connection degree among the nodes and their own soft error probability, an importance analysis model is proposed. And then the testing points are optimized based on the importance of each node using the proposed importance analysis model. The test results indicate that the method is a feasible optimization method.

KW - FPGA

KW - Important analysis

KW - Optimization

KW - Soft error of single event effect

KW - Testing points

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U2 - 10.1109/PHM.2016.7819773

DO - 10.1109/PHM.2016.7819773

M3 - 会议稿件

AN - SCOPUS:85015704779

T3 - Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

BT - Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

A2 - Miao, Qiang

A2 - Li, Zhaojun

A2 - Zuo, Ming J.

A2 - Xing, Liudong

A2 - Tian, Zhigang

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016

Y2 - 19 October 2016 through 21 October 2016

ER -

Zhou G, Gao X, Lai X, Zhu Q, Ju T, Guo Y et al. FPGA testing points optimization method based on important analysis. In Miao Q, Li Z, Zuo MJ, Xing L, Tian Z, editors, Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016. Institute of Electrical and Electronics Engineers Inc. 2017. 7819773. (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016). doi: 10.1109/PHM.2016.7819773

FPGA testing points optimization method based on important analysis

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