Formation of stress-induced nano defects in shear bands of metallic glasses

Xiaofeng Gu, Jun Wang, Weidong Qin, Hongchao Kou, Jinshan Li, Lian Zhou

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Transmission electron microscopy (TEM) specimens of Zr-based metallic glasses were prepared from amorphous ribbons. Shear bands produced by bending these specimens were located by TEM. High resolution transmission electron microscopy analysis indicates the existence of nanoscale void-like defects and high-density areas in shear bands. The formation of these defects is believed resulting from the evolution of stress-activated free volumes during the mechanical loading and the removal of external stress, which can be understood by comparing the stress-induced processes in shear bands in analogy with the thermal annealing effects on similar metallic glasses.

Original languageEnglish
Pages (from-to)941-944
Number of pages4
JournalXiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering
Volume39
Issue number6
StatePublished - Jun 2010

Keywords

  • Annealing
  • Metallic glass
  • Shear band
  • Transmission electron microscopy

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