Abstract
Recent development of large area flat panel solid state detector arrays indicates that flat panel image sensors have some common potential advantages: compactness, absence of geometric distortion and veiling glare with the benefits of high resolution, high DQE, high frame rate and high dynamic range, small image lag (<1%) and excellent linearity (approximately 1%). The advantages of the new flat-panel detector make it a promising candidate for cone beam volume CT imaging. The purpose of this study is to characterize an amorphous silicon thin film transistor (STFT) flat panel detector-based imaging system for cone beam volume CT applications. A prototype STFT detector-based cone beam volume CT imaging system has been designed and constructed based on the modification of a GE 8800 CT scanner. This system is evaluated using two phantoms: a low contrast phantom, and a GE CT quality assurance phantom. The results indicate that the flat panel detector-based volume cone beam can achieve a better spatial resolution than that of a standard fan beam CT and a low contrast resolution approaching that of a standard fan beam CT. The results also suggest that to use a flat panel detector for cone beam Volume CT, the design and construction of the detector should be optimized for tomographic acquisition and reconstruction.
| Original language | English |
|---|---|
| Pages (from-to) | 192-203 |
| Number of pages | 12 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3659 |
| Issue number | I |
| State | Published - 1999 |
| Externally published | Yes |
| Event | Proceedings of the 1999 Medical Imaging - Physics of Medical Imaging - San Diego, CA, USA Duration: 21 Feb 1999 → 23 Feb 1999 |