Fault diagnosis of star-connected auto-transformer based 24-pulse rectifier

Wei Wu, Xiaobin Zhang, Wenli Yao, Weilin Li

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper proposes a fault diagnosis method for star-connected auto-transformer based 24-pulse rectifier by integrating artificial neural networks (ANN) with wavelet packet decomposition (WPD) and principal component analysis (PCA). The WPD is employed to extract the features of different fault waveforms of the output voltage of the rectifier. PCA is adopted to reduce the dimensionality of the extracted feature vectors, which leads to fast computation of the algorithm. BP neural network is adopted to classify the fault types and determine the fault location according to the extracted features. These faults are simulated in real-time simulation platform and the data are then analyzed with MATLAB. Compared with other diagnosis methods, the proposed method shows better performance and faster response.

Original languageEnglish
Title of host publication2014 IEEE International Workshop on Applied Measurements for Power Systems, AMPS 2014 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages132-137
Number of pages6
ISBN (Electronic)9781479968237
DOIs
StatePublished - 5 Nov 2014
Event5th IEEE International Workshop on Applied Measurements for Power Systems, AMPS 2014 - Aachen, Germany
Duration: 24 Sep 201426 Sep 2014

Publication series

Name2014 IEEE International Workshop on Applied Measurements for Power Systems, AMPS 2014 - Proceedings

Conference

Conference5th IEEE International Workshop on Applied Measurements for Power Systems, AMPS 2014
Country/TerritoryGermany
CityAachen
Period24/09/1426/09/14

Keywords

  • ATRU
  • BP neural network
  • fault diagnosis
  • PCA
  • WPD

Fingerprint

Dive into the research topics of 'Fault diagnosis of star-connected auto-transformer based 24-pulse rectifier'. Together they form a unique fingerprint.

Cite this