Evaluation of mission success for binary system with repairable spare parts

Z. Q. Cai, P. Guo, Y. Li, W. T. Si

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Mission success probability means the ability of a system to fulfill its mission in a prescribe task profile. In this paper, a hierarchical modeling method is proposed for the mission success evaluation of multi-stage system with repairable spare parts. The binary decision diagram (BDD) was used to represent the system structure function. The component and its corresponding repairable spare parts were formed as a group for overall consideration. The component groups were represented by the continuous time Markov chain model. It can describe the component failure process and the repair behaviors simultaneously. Then a simple case study for a radar system was carried out. Evaluation results verified the practicability and effectiveness of the proposed hierarchical modeling method.

Original languageEnglish
Title of host publication2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016
PublisherIEEE Computer Society
Pages526-530
Number of pages5
ISBN (Electronic)9781509036653
DOIs
StatePublished - 27 Dec 2016
Event2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016 - Bali, Indonesia
Duration: 4 Dec 20167 Dec 2016

Publication series

NameIEEE International Conference on Industrial Engineering and Engineering Management
Volume2016-December
ISSN (Print)2157-3611
ISSN (Electronic)2157-362X

Conference

Conference2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016
Country/TerritoryIndonesia
CityBali
Period4/12/167/12/16

Keywords

  • Decision diagram
  • Markov chain
  • mission success
  • repairable system
  • spare parts

Fingerprint

Dive into the research topics of 'Evaluation of mission success for binary system with repairable spare parts'. Together they form a unique fingerprint.

Cite this