Enhanced the flux pinning in Bi-2223/Ag by induced Cr-ion defects

M. H. Pu; Y. Feng; P. X. Zhang; L. Zhou; J. X. Wang; Y. P. Sun; J. J. Du

doi:10.1016/S0921-4534(02)02129-9

Enhanced the flux pinning in Bi-2223/Ag by induced Cr-ion defects

M. H. Pu, Y. Feng, P. X. Zhang, L. Zhou, J. X. Wang, Y. P. Sun, J. J. Du

Research output: Contribution to journal › Conference article › peer-review

16 Scopus citations

Abstract

(Bi,Pb)_2.2Sr₂Ca_2.2Cu_3-xCr_xO_y silver sheathed tapes with x = 0.0 (un-doped), 0.0005, 0.001, 0.002 and 0.004 (Cr-doped) have been investigated. X-ray diffraction analyses and transmission electron microscopy observation manifest that partial Cr substitution for Cu may introduce a lot of fine Cr-ion defects into the samples. The different performances of critical current densities (at 77 K) under applied magnetic fields, the irreversibility lines and activation energies of flux motion indicate that their flux pinning has been enhanced by induced Cr-ion defects obviously. Their pinning forces have also been analyzed, and the results imply that the flux pinning in Cr-doped tapes enhanced mainly originate from the fine normal-like Cr-ion defects.

Original language	English
Pages (from-to)	41-46
Number of pages	6
Journal	Physica C: Superconductivity and its Applications
Volume	386
DOIs	https://doi.org/10.1016/S0921-4534(02)02129-9
State	Published - 15 Apr 2003
Externally published	Yes
Event	ICMC 2002 - Xi an, China Duration: 16 Jun 2002 → 20 Jun 2002

Keywords

(Bi,Pb)-2223/Ag tapes
Cr-ion defects
Flux pinning

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10.1016/S0921-4534(02)02129-9

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title = "Enhanced the flux pinning in Bi-2223/Ag by induced Cr-ion defects",

abstract = "(Bi,Pb)2.2Sr2Ca2.2Cu3-xCrx Oy silver sheathed tapes with x = 0.0 (un-doped), 0.0005, 0.001, 0.002 and 0.004 (Cr-doped) have been investigated. X-ray diffraction analyses and transmission electron microscopy observation manifest that partial Cr substitution for Cu may introduce a lot of fine Cr-ion defects into the samples. The different performances of critical current densities (at 77 K) under applied magnetic fields, the irreversibility lines and activation energies of flux motion indicate that their flux pinning has been enhanced by induced Cr-ion defects obviously. Their pinning forces have also been analyzed, and the results imply that the flux pinning in Cr-doped tapes enhanced mainly originate from the fine normal-like Cr-ion defects.",

keywords = "(Bi,Pb)-2223/Ag tapes, Cr-ion defects, Flux pinning",

author = "Pu, {M. H.} and Y. Feng and Zhang, {P. X.} and L. Zhou and Wang, {J. X.} and Sun, {Y. P.} and Du, {J. J.}",

year = "2003",

month = apr,

day = "15",

doi = "10.1016/S0921-4534(02)02129-9",

language = "英语",

volume = "386",

pages = "41--46",

journal = "Physica C: Superconductivity and its Applications",

issn = "0921-4534",

publisher = "Elsevier B.V.",

note = "ICMC 2002 ; Conference date: 16-06-2002 Through 20-06-2002",

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TY - JOUR

T1 - Enhanced the flux pinning in Bi-2223/Ag by induced Cr-ion defects

AU - Pu, M. H.

AU - Feng, Y.

AU - Zhang, P. X.

AU - Zhou, L.

AU - Wang, J. X.

AU - Sun, Y. P.

AU - Du, J. J.

PY - 2003/4/15

Y1 - 2003/4/15

N2 - (Bi,Pb)2.2Sr2Ca2.2Cu3-xCrx Oy silver sheathed tapes with x = 0.0 (un-doped), 0.0005, 0.001, 0.002 and 0.004 (Cr-doped) have been investigated. X-ray diffraction analyses and transmission electron microscopy observation manifest that partial Cr substitution for Cu may introduce a lot of fine Cr-ion defects into the samples. The different performances of critical current densities (at 77 K) under applied magnetic fields, the irreversibility lines and activation energies of flux motion indicate that their flux pinning has been enhanced by induced Cr-ion defects obviously. Their pinning forces have also been analyzed, and the results imply that the flux pinning in Cr-doped tapes enhanced mainly originate from the fine normal-like Cr-ion defects.

AB - (Bi,Pb)2.2Sr2Ca2.2Cu3-xCrx Oy silver sheathed tapes with x = 0.0 (un-doped), 0.0005, 0.001, 0.002 and 0.004 (Cr-doped) have been investigated. X-ray diffraction analyses and transmission electron microscopy observation manifest that partial Cr substitution for Cu may introduce a lot of fine Cr-ion defects into the samples. The different performances of critical current densities (at 77 K) under applied magnetic fields, the irreversibility lines and activation energies of flux motion indicate that their flux pinning has been enhanced by induced Cr-ion defects obviously. Their pinning forces have also been analyzed, and the results imply that the flux pinning in Cr-doped tapes enhanced mainly originate from the fine normal-like Cr-ion defects.

KW - (Bi,Pb)-2223/Ag tapes

KW - Cr-ion defects

KW - Flux pinning

UR - http://www.scopus.com/inward/record.url?scp=0037445724&partnerID=8YFLogxK

U2 - 10.1016/S0921-4534(02)02129-9

DO - 10.1016/S0921-4534(02)02129-9

M3 - 会议文章

AN - SCOPUS:0037445724

SN - 0921-4534

VL - 386

SP - 41

EP - 46

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

T2 - ICMC 2002

Y2 - 16 June 2002 through 20 June 2002

ER -

Enhanced the flux pinning in Bi-2223/Ag by induced Cr-ion defects

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Keywords

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