Electronic structure of SiC (310) twin boundary doped with B, N, Al and Ti

Yajing Ye, Litong Zhang, Kehe Su, Laifei Cheng, Yongdong Xu

Research output: Contribution to journalArticlepeer-review

Abstract

Doping of boron, nitrogen, aluminum and titanium in the SiC (310) twin boundary was investigated, and the first-principle calculation was used to analyze the underlying mechanism of excellent creep resistance and strength of Sylramic and Tyranno SA SiC fibers. The electronic structures were also analyzed and compared. The results of Mulliken overlap populations, electron density differences and density of states reveal that doping of B or N atom reinforces SiC GBs bonding, however, doping of Al or Ti atom weakens SiC GBs bonding. The reinforced SiC GBs will largely prevent atoms from sliding near GBs. The experimental results would be one of the reasons which lead to the reinforcement of either creep resistance or the strength of SiC fibers.

Original languageEnglish
Pages (from-to)599-602
Number of pages4
JournalJournal Wuhan University of Technology, Materials Science Edition
Volume24
Issue number4
DOIs
StatePublished - Aug 2009

Keywords

  • Ceramic
  • Density functional theory
  • Electronic structure
  • Grain boundaries

Fingerprint

Dive into the research topics of 'Electronic structure of SiC (310) twin boundary doped with B, N, Al and Ti'. Together they form a unique fingerprint.

Cite this