Effects of the length of thru on the measurement precision in TRL technique

Changying Wu; Yuanchao Xu; Jianying Li; Steven Gao

doi:10.1109/LMWC.2014.2361660

Effects of the length of thru on the measurement precision in TRL technique

Changying Wu, Yuanchao Xu, Jianying Li, Steven Gao

School of Electronics and Information

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

The effect of the length of Thru on measurement precision in Thru-Reflect-Line (TRL) technique is investigated for the first time. Additional error matrices are introduced to represent random connection errors caused by soldering the adaptors and the test fixture. The simulated results show that the length of Thru periodically reduces the effects of connection errors on measurement results, and the length of Thru causing minimum error varies with the impedances of devices under test. The results are verified by experiments in which the copper tape is used to emulate and enlarge randomly distributed connection errors.

Original language	English
Article number	6924783
Pages (from-to)	905-907
Number of pages	3
Journal	IEEE Microwave and Wireless Components Letters
Volume	24
Issue number	12
DOIs	https://doi.org/10.1109/LMWC.2014.2361660
State	Published - 1 Dec 2014

Keywords

Calibration
error matrix
test fixture
thru-reflect-line (TRL) technique

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10.1109/LMWC.2014.2361660

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abstract = "The effect of the length of Thru on measurement precision in Thru-Reflect-Line (TRL) technique is investigated for the first time. Additional error matrices are introduced to represent random connection errors caused by soldering the adaptors and the test fixture. The simulated results show that the length of Thru periodically reduces the effects of connection errors on measurement results, and the length of Thru causing minimum error varies with the impedances of devices under test. The results are verified by experiments in which the copper tape is used to emulate and enlarge randomly distributed connection errors.",

keywords = "Calibration, error matrix, test fixture, thru-reflect-line (TRL) technique",

author = "Changying Wu and Yuanchao Xu and Jianying Li and Steven Gao",

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AU - Xu, Yuanchao

AU - Li, Jianying

AU - Gao, Steven

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N2 - The effect of the length of Thru on measurement precision in Thru-Reflect-Line (TRL) technique is investigated for the first time. Additional error matrices are introduced to represent random connection errors caused by soldering the adaptors and the test fixture. The simulated results show that the length of Thru periodically reduces the effects of connection errors on measurement results, and the length of Thru causing minimum error varies with the impedances of devices under test. The results are verified by experiments in which the copper tape is used to emulate and enlarge randomly distributed connection errors.

AB - The effect of the length of Thru on measurement precision in Thru-Reflect-Line (TRL) technique is investigated for the first time. Additional error matrices are introduced to represent random connection errors caused by soldering the adaptors and the test fixture. The simulated results show that the length of Thru periodically reduces the effects of connection errors on measurement results, and the length of Thru causing minimum error varies with the impedances of devices under test. The results are verified by experiments in which the copper tape is used to emulate and enlarge randomly distributed connection errors.

KW - Calibration

KW - error matrix

KW - test fixture

KW - thru-reflect-line (TRL) technique

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ER -

Effects of the length of thru on the measurement precision in TRL technique

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Keywords

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