TY - JOUR
T1 - Effects of applied bias voltage on the properties of a-C
T2 - H films
AU - Yin, Dachuan
AU - Xu, Niankan
AU - Liu, Zhengtang
AU - Han, Yong
AU - Zheng, Xiulin
PY - 1996/1
Y1 - 1996/1
N2 - The effects of the applied negative bias voltage on the hydrogen content, refractive index, extinction coefficient, internal stress, Vickers microhardness, adhesion and growth rate of a-C : H films deposited from a C2H2 + Ar mixture by a d.c.-r.f. plasma-enhanced chemical vapour deposition process have been investigated. The results showed that the properties of a-C : H films strongly depend on the applied bias voltage. In the investigated bias range (-400 to -1000 V), it was found that, apart from the growth rate and extinction coefficient (which were found to increase with increasing bias), all the other properties studied showed a maximum at around -800 to -900 V. Compared with those studies reported previously on self-bias voltage effects, these results indicated a slight difference between the effects of the self-bias voltage and applied bias voltage. The experimental results are discussed.
AB - The effects of the applied negative bias voltage on the hydrogen content, refractive index, extinction coefficient, internal stress, Vickers microhardness, adhesion and growth rate of a-C : H films deposited from a C2H2 + Ar mixture by a d.c.-r.f. plasma-enhanced chemical vapour deposition process have been investigated. The results showed that the properties of a-C : H films strongly depend on the applied bias voltage. In the investigated bias range (-400 to -1000 V), it was found that, apart from the growth rate and extinction coefficient (which were found to increase with increasing bias), all the other properties studied showed a maximum at around -800 to -900 V. Compared with those studies reported previously on self-bias voltage effects, these results indicated a slight difference between the effects of the self-bias voltage and applied bias voltage. The experimental results are discussed.
KW - A-C:H films
KW - Applied bias
KW - d.c.-r.f. PECVD
UR - http://www.scopus.com/inward/record.url?scp=0011408830&partnerID=8YFLogxK
U2 - 10.1016/0257-8972(94)02387-5
DO - 10.1016/0257-8972(94)02387-5
M3 - 文章
AN - SCOPUS:0011408830
SN - 0257-8972
VL - 78
SP - 31
EP - 36
JO - Surface and Coatings Technology
JF - Surface and Coatings Technology
IS - 1-3
ER -