Effective reduction of the phase error for gamma nonlinearity in phase measuring profilometry by BLPF

Xiaxia Zhao, Rong Mo, Zhiyong Chang, Jin Lu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In phase measuring profilometry, the system gamma nonlinearity makes the captured fringe patterns non-sinusoidal, which causes the computed phase to exist a non-ignorable error and seriously affects the 3D reconstruction accuracy. Based on the detailed study of the existing gamma nonlinearity compensation and phase error reduction technique, a method based on low-pass frequency domain filtering is proposed. It mainly filters out higher than one-order harmonic components induced by the gamma nonlinearity in conditions of holding as much power as possible in the power spectrum, thus improves sinusoidal waveform of the fringe images. Compared to other compensation methods, the complex mathematic model is not needed in the proposed method. The simulation and experiments confirm that the higher-order harmonic components are significantly reduced, the phase precision can be effectively improved and a certain accuracy requirement can be reached.

Original languageEnglish
Title of host publication2017 International Conference on Optical Instruments and Technology
Subtitle of host publicationOptoelectronic Devices and Optical Signal Processing
EditorsFabien Bretenaker, Jian Chen, Yi Dong
PublisherSPIE
ISBN (Electronic)9781510617452
DOIs
StatePublished - 2018
Event2017 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Optical Signal Processing - Beijing, China
Duration: 28 Oct 201730 Oct 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10617
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2017 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Optical Signal Processing
Country/TerritoryChina
CityBeijing
Period28/10/1730/10/17

Keywords

  • Algorithms and filters.
  • Image recognition
  • Phase measurement Fringe analysis

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